The ZSSC3123 cLite™ is a CMOS integrated circuit for accurate capacitance-to-digital conversion and sensor-specific correction of capacitive sensor signals. Digital compensation of sensor offset, sensitivity and temperature drift is accomplished via an internal digital signal processor running a correction algorithm with calibration coefficients stored in a nonvolatile EEPROM. The ZSSC3123 is configurable for capacitive sensors with capacitances up to 260pF and a sensitivity of 125aF/LSB to 1pF/LSB depending on resolution, speed, and range settings. It is compatible with both single capacitive sensors (both terminals must be accessible) and differential capacitive sensors. Measured and corrected sensor values can be output as I2C, SPI, PDM, or alarms. The I2C interface can be used for a simple PC-controlled calibration procedure to program a set of calibration coefficients into an on-chip EEPROM. The calibrated ZSSC3123 and a specific sensor are mated digitally: fast, precise, and without the cost overhead of trimming by external devices or laser.

Features

  • Maximum target input capacitance: 260pF
  • Sampling rates as fast as 0.7ms @ 8-bit, 1.6ms @ 10-bit, 5.0ms @ 12-bit, 18.5ms @ 14-bit
  • Digital compensation of sensor: piece-wise 1st and 2nd order sensor compensation or up to 3rd order single-region sensor compensation
  • Digital compensation of 1st and 2nd order temperature gain and offset drift
  • Internal temperature compensation reference (no external components)
  • Programmable capacitance span and offset
  • Layout customized for die-die bonding with sensor for low-cost, high-density chip-on-board assembly
  • Accuracy as high as ±0.25% full-scale output @ -40°C to 125°C, 3V, 5V, Vsupply ±10% (see data sheet section 1.3 for restrictions)

Product Options

注文可能な製品ID Part Status Pkg. Code Pkg. Type Lead Count (#) Temp. Range Carrier Type 購入/サンプル
ZSSC3123AA1B Active DICE WAFER 0 -40 to 125°C Wafer
Availability
ZSSC3123AA1C Active DICEF WAFER 0 -40 to 125°C Wafer
Availability
ZSSC3123AA2R Active PGG14 TSSOP 14 -40 to 125°C Reel
Availability
ZSSC3123AA2T Active PGG14 TSSOP 14 -40 to 125°C Tube
Availability
ZSSC3123AI1B Active DICE WAFER 0 -40 to 85°C Wafer
Availability
ZSSC3123AI1C Active DICEF WAFER 0 -40 to 85°C Wafer
Availability
ZSSC3123AI2R Active PGG14 TSSOP 14 -40 to 85°C Reel
Availability
ZSSC3123AI2T Active PGG14 TSSOP 14 -40 to 85°C Tube
Availability

技術資料

タイトル 他の言語 タイプ 形式 サイズ 日付
データシート
ZSSC3123 Datasheet Datasheet PDF 1.24 MB
ZSSC3123 Short-Form Datasheet Short Form Datasheet PDF 338 KB
ユーザーガイド
Choosing the Right Sensor Signal Conditioning IC Guide PDF 300 KB
IDT CAD Altium Libraries for AID Products Rev 20160819 Guide ZIP 1.20 MB
ZSSC3122/ZSSC3123/ZSC31210 SSC Modular Evaluation Kit Description Manual PDF 708 KB
アプリケーションノート、ホワイトペーパー
ZSSC3122-23 Application Note - Overvoltage and Reverse Polarity Protection Application Note PDF 92 KB
ZSC3120-ZSSC3122-23 Calibration Sequence and Calibration DLL Application Note PDF 314 KB
IDT Wafer Dicing Guidelines Application Note PDF 44 KB
その他資料
Sensing Technologies and Sensor Solutions Overview 简体中文 Overview PDF 2.57 MB
Sensor Signal Conditioning ICs for Industrial and Consumer Applications (日本語) English Overview PDF 6.88 MB

ソフトウェア/ツール

タイトル 他の言語 タイプ 形式 サイズ 日付
ZSSC3122 and ZSSC3123 Evaluation Kit Software Rev. 1.4.7.1 Software ZIP 911 KB

Evaluation Boards

Part Number Title 昇順で並び替え
ZSSC3123-MCS Mass Calibration System of ZSSC3123
ZSSC3122-3123KIT Evaluation Kit for ZSSC3122 and ZSSC3123